Microwave devices and circuits for communications applications are investigated. The lab is well equipped for RF-, microwave-and millimetre-wave testing of packaged or on-wafer devices and components. Active opto-electronic devices and circuits can be characterized along with RF, MEMS, antennas, multi-layer circuits, on-wafer and packaged devices. The lab is equipped with a probe station with four positioners and high-frequency probes. The lab also has a large anechoic chamber with associated signal sources and components for accurate fully automated antenna characterization.