Wafer Level Test

Two Wentworth M901 probe stations with 100 mm diameter chucks are available for general-purpose DC characterization. Each of these stations has an associated HP4145A Semiconductor Parameter Analyzer. Access to a Cascade Microtech 9000 prober connected to an HP8720A network analyzer is available for on-wafer s-parameter measurement.

Department of Electronics
Mackenzie Building 5170
1125 Colonel By Drive,
Ottawa, ON K1S 5B6

Tel: 613-520-5755 Fax: 613-520-5708

Email: info@doe.carleton.ca

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